journal article·2011-07Open access

New Design and Measurements with 60 mm2 Rococo2 SDD Detectors

A Niculae, M Bornschlegl, R Eckhardt, J Herrmann, O Jaritschin, P Lechner, A Liebel, H Soltau, G Schaller, F Schopper, L Strüder

Microscopy and Microanalysis· Volume 17· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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References

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