Introduction: Characterization of Nonconductive Materials

This special issue of Microscopy and Microanalysis contains 17 articles from a topical conference on microbeam characterization of nonconductive materials. The conference was held at the Department of Mining, Metals, and Materials Engineering of McGill University in Montreal on August 2–3, 2002, as the pre-meeting congress prior to the Microscopy & Microanalysis 2002 meeting in Quebec City, Canada.