Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang; A.I. Kirkland; P.D. Nellist; A.J. D’Alfonso; A.J. Morgan; L.J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; M. Shimojo

doi:10.1017/s1431927612004515

journal article·2012-07

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A.I. Kirkland, P.D. Nellist, A.J. D’Alfonso, A.J. Morgan, L.J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Microscopy and Microanalysis· Volume 18· Issue S2

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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Fluorescence Microscopy Techniques

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