Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn
Source abstract
Abstract
Tsengming Chou, Maureen E Williams; Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pages
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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