journal article·2007-08

Non-Conductive Specimens and Prevention of Electron Beam Charging

H-J Fitting

Microscopy and Microanalysis· Volume 13· Issue S02
Publisher page

Abstract

Extract Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Advanced Materials Characterization Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

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