DataVXMicroscopy and MicroanalysisPaper
journal article·2012-07

Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

A.Y. Borisevich, Y. Kim, M.P. Oxley, S.J. Pennycook, S.V. Kalinin, A. Morozovska, E. Eliseev, Y. Chu, P. Yu

Microscopy and Microanalysis· Volume 18· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications

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References

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