X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector
Source abstract
Abstract
Hendrix Demers, Nicolas Brodusch, Richard Wuhrer, Ken Moran, Patrick Woo, Raynald Gauvin; X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-A
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
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