journal article·2007-09

Improved Performance of Electron Holography with Tecnai F20 Cs-corr

D Geiger, H Lichte, M Linck, M Lehmann, B Freitag, M Haider

Microscopy and Microanalysis· Volume 13· Issue S03
Publisher page

Abstract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Nuclear Physics and Applications · Electron and X-Ray Spectroscopy Techniques

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References

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