In situ Transmission Electron Microscopy Study of Dislocation Emission At Junctions Between Σ=3 Grain Boundaries In Gold Thin Films
Source abstract
Abstract
G Lucadamo, DL Medlin; In situ Transmission Electron Microscopy Study of Dislocation Emission At Junctions Between Σ=3 Grain Boundaries In Gold Thin Films,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Surface and Thin Film Phenomena · Magnetic properties of thin films · Advanced Materials Characterization Techniques
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References
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