journal article·2003-09

TEM Microstructure Investigation of Si/Ge Superlattice Exhibiting 1.55 μm Photoluminescence at Room Temperature

N.D. Zakharov, V.G. Talalaev, G.E. Cirlin, A. Tonkikh, P. Werner

Microscopy and Microanalysis· Volume 9· Issue S03
Publisher page

Abstract

ND Zakharov, VG Talalaev, GE Cirlin, A Tonkikh, P Werner; TEM Microstructure Investigation of Si/Ge Superlattice Exhibiting 1.55 μm Photoluminescence at Ro
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies

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