Latest applications of ToF-SIMS characterization for next-generation electronic materials
Source abstract
Abstract
Tanguy Terlier, Qing Ai, Siraj Sidhik, Aditya Mohite, Yan Yao, Ming Tang, Jun Lou; Latest applications of ToF-SIMS characterization for next-generation ele
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Semiconductor materials and devices · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Rice University SIMS laboratory, Shared Equipment Authority, , Houston, TX 77005, USA
Rice University Department of Materials Science and Nano Engineering, , Houston, TX 77005, USA
Rice University Department of Chemical and Biomolecular Engineering, , Houston, TX 77005, USA
University of Houston Department of Electrical and Computer Engineering, , Houston, TX 77204, USA
References (4)
Show source-provided references
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3. Liang · Advanced Materials · 2020 · Volume 32 · 200411110.1002/adma.202004111 ↗
4. Yuan · Nano Letter · 2019 · Volume 19 · 377710.1021/acs.nanolett.9b00905 ↗