Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM
Source abstract
Abstract
Oscar Recalde, Tianshu Jiang, Robert Eilhardt, Alexander Zintler, Yating Ruan, Alexey Arzumanov, Tijn van Omme, Gin Pivak, Hector H Perez-Garza, Philipp Ko
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Ferroelectric and Negative Capacitance Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Technical University of Darmstadt Advanced Electron Microscopy Division, Department of Materials- and Earth Science, , Darmstadt, Hessen, Germany
Technical University of Darmstadt Advanced Thin Film Technology Division, Department of Materials- and Earth Science, , Darmstadt, Hessen, Germany
DENSsolutions , Delft, Netherlands
References (4)
Show source-provided references
1. Molina-Luna · Nature Communications · 2018 · 9 · 444510.1038/s41467-018-06959-8 ↗
2. Zhang · Nature Communications · 2017 · 8 · 10410.1038/s41467-017-00121-6 ↗
3. Nukala · Science · 2021 · 372 · 63010.1126/science.abf3789 ↗
4. Sato · Applied Physics Letters · 2017 · 111 · 06290410.1063/1.4986361 ↗