journal article·1999-09

Microsc. Microanal., Vol. 5, No. 3, May/June 1999, pp. 173–186

Authors not provided

Microscopy and Microanalysis· Volume 5· Issue 5
Publisher page

Abstract

In the article Characterization of the Absolute Crystal Polarity across Twin Boundaries in Gallium Phosphide Using Convergent-Beam Electron Diffraction, by Dov Cohen, Stuart McKernan, and C. Barry Carter, because of a printing error, Figures 4 and 5 were not printed in complete form. The publisher regrets the error. The figures are reprinted here as they should appear.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques

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References

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