Imaging Contrast with Multiple Ion Beams
Source abstract
Abstract
Huimeng Wu, Sybren Sijbrandij, Shawn McVey, John Notte; Imaging Contrast with Multiple Ion Beams, Microscopy and Microanalysis, Volume 21, Issue S3, 1 Augu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S143192760808592910.1017/S1431927608085929 ↗
2. 10.1116/1.235796710.1116/1.2357967 ↗