Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices
Source abstract
Abstract
Jian-Min Zuo, Xiurong Zhu; Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices, Microscopy and Microanalysi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Machine Learning in Materials Science · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Precession electron diffraction - a topical review10.1107/S2052252514022283 ↗
2. Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera10.4028/www.scientific.net/MSF.495-497.197 ↗
3. cloudEMAPS: A Cloud Computing Environment for Electron Microscopy Application Simulations10.1017/S1551929520001583 ↗
4. Improvements in electron diffraction pattern automatic indexing algorithms10.1051/epjap/2017160444 ↗
5. Zuo · 2019