Microanalysis of Cd Whiskers on Cd Plated Long-Term Used Hardware
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Abstract
Sara Dickens, Tim Ruggles, Rachel White, Zahra Ghanbari, Daniel Perry, Donald Susan; Microanalysis of Cd Whiskers on Cd Plated Long-Term Used Hardware, Mic
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electronic and Structural Properties of Oxides · Electron and X-Ray Spectroscopy Techniques
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References (4)
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1. 3. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525
2. 4. SAND2021-2100 C
3. Growth of Zinc and Cadmium Whiskers10.1002/pssb.19670230228 ↗
4. X-ray Investigation on the Growth of Cd Whiskers10.1016/0022-0248(68)90248-0 ↗