Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy
Source abstract
Abstract
Suzy Vitale, Joshua Sugar; Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy, Microscopy and M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
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1. Giannuzzi · Microscopy and Microanalysis · 2011 · 17 · 64610.1017/S1431927611004107 ↗
2. Kelley · Microscopy and Microanalysis · 2013 · 19 · 86210.1017/S1431927613006302 ↗
3. MacLaren · Microscopy and Microanalysis · 2019 · 25 · 11510.1017/S1431927618016239 ↗
4. Wirth · European Journal of Mineralogy · 2004 · 16 · 86310.1127/0935-1221/2004/0016-0863 ↗
5. Hugo · Scripta Materialia · 1999 · 41 · 134110.1016/S1359-6462(99)00293-6 ↗
6. Nicholas · Journal of Materials Science · 1979 · 14 · 110.1007/BF01028323 ↗
7. Senel · Corrosion Science · 2014 · 85 · 16710.1016/j.corsci.2014.04.012 ↗
8. Burnett · Ultramicroscopy · 2016 · 161 · 11910.1016/j.ultramic.2015.11.001 ↗
9. Malis · Journal of Microscope Technique · 1988 · 8 · 19310.1002/jemt.1060080206 ↗