Probing the Strain Fields of Single-Atom Defects in 2D materials with Sub-Picometer Precision
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Abstract
Chia-Hao Lee, Abid Khan, Di Luo, Tatiane Santos, Chuqiao Shi, Blanka Janicek, Sangmin Kang, Nahil Sobh, Wenjuan Zhu, André Schleife, Bryan Clark, Pinshane
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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References (3)
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1. [2] Code available at: https://github.com/ClarkResearchGroup/stem-learning
2. [3] This work is supported primarily through DOE BES under DE-SC0020190. Additional support from AFOSR FA9550-7-1-0213, ONR grant numbers N00014-17-1-2973 and N00014-18-1-2605, NSF OCI-0725070 and ACI-1238993, and the state of Illinois. This work was carried out in part in the Materials Research Laboratory at UIUC.
3. Lee · Nano Letters · 2020 · 20 · 336910.1021/acs.nanolett.0c00269 ↗