Reproducible in-situ electrical biasing of resistive memory materials using piezo-controlled electrical contacts and chip based systems.
Source abstract
Abstract
David Cooper, Matthew Bryan; Reproducible in-situ electrical biasing of resistive memory materials using piezo-controlled electrical contacts and chip base
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. Muller · Nature · 2004 · 430 · 65710.1038/nature02756 ↗
2. Cooper · Advanced Materials · 2017 · 29 · 170021210.1002/adma.201700212 ↗
3. Waser · Nature Materials · 2007 · 6 · 83310.1038/nmat2023 ↗
4. [4] Acknowledgments: David Cooper thanks the European Research Council for funding the Starting Grant Holoview (Stg:506535). These experiments were performed on the platform Nanocharacterisation at Minatec (PFNC).