Advances in Scanning Microwave Impedance Microscopy
Source abstract
Abstract
Ravi Chandra Chintala, Yongliang Yang; Advances in Scanning Microwave Impedance Microscopy, Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 202
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis · Microwave and Dielectric Measurement Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/j.apsusc.2017.06.26110.1016/j.apsusc.2017.06.261 ↗
2. 10.1007/s13204-011-0002-710.1007/s13204-011-0002-7 ↗
3. 10.1021/acsnano.5b0791910.1021/acsnano.5b07919 ↗
4. Lai · Review of Scientific Instruments · 2009 · 80