journal article·2020-08Open access

Artificial Intelligence Enabled Information Inpainting and Artifact Removal for Electron Tomography

Huolin Xin, He Wei, Guanglei Ding, Chunyang Wang, Yitong Liu, Rui Zhang

Microscopy and Microanalysis· Volume 26· Issue S2

Abstract

Huolin Xin, He Wei, Guanglei Ding, Chunyang Wang, Yitong Liu, Rui Zhang; Artificial Intelligence Enabled Information Inpainting and Artifact Removal for El
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

Show source-provided references
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2. 10.1177/01617346840060010710.1177/016173468400600107 ↗
3. 10.1038/s41598-019-49267-x10.1038/s41598-019-49267-x ↗