Measuring Interatomic Bonding and Charge Redistributions in Defects by Combining 4D-STEM and STEM Multislice Simulations
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Abstract
Damien Heimes, Jürgen Belz, Andreas Beyer, Kerstin Volz; Measuring Interatomic Bonding and Charge Redistributions in Defects by Combining 4D-STEM and STEM
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena
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References (9)
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1. 10.1038/ncomms665310.1038/ncomms6653 ↗
2. Electronic structure calculations with GPAW: a real-space implementation of the projector augmented-wave method
3. 10.1063/1.481598510.1063/1.4815985 ↗
4. 10.1016/j.ultramic.2016.05.00410.1016/j.ultramic.2016.05.004 ↗
5. 10.1016/j.ultramic.2018.11.00210.1016/j.ultramic.2018.11.002 ↗
6. 10.1038/ncomms1563110.1038/ncomms15631 ↗
7. 10.1016/j.ultramic.2017.03.01010.1016/j.ultramic.2017.03.010 ↗
8. 10.1038/s41586-019-1649-610.1038/s41586-019-1649-6 ↗
9. 10.1007/978-1-4419-6533-210.1007/978-1-4419-6533-2 ↗