Imaging the Structure and Properties of 2D Materials with 4D-STEM

David Muller; Zhen Chen; Yi Jiang; Michal Odstrcil

doi:10.1017/s1431927620015329

journal article·2020-08Open access

Imaging the Structure and Properties of 2D Materials with 4D-STEM

David Muller, Zhen Chen, Yi Jiang, Michal Odstrcil

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

David Muller, Zhen Chen, Yi Jiang, Michal Odstrcil; Imaging the Structure and Properties of 2D Materials with 4D-STEM, Microscopy and Microanalysis, Volume

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Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Electron and X-Ray Spectroscopy Techniques

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References (6)

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6. [6] We thank Park, Jiwoong , Xie, Saien , Gao, Hui , Chiu, Ming-Hui , and Li, Lain-Jong for samples. Research supported by US National Science Foundation (grants DMR-1539918, DMR-1719875, DMR-1429155).