Neon-FIB for the Fabrication of Tips for Atom Probe Tomography and Electron Tomography

Frances Allen; John Notte; Deying Xia; Paul Blanchard; Ruopeng Zhang; Andrew Minor; Norman Sanford

doi:10.1017/s1431927620013719

journal article·2020-08Open access

Neon-FIB for the Fabrication of Tips for Atom Probe Tomography and Electron Tomography

Frances Allen, John Notte, Deying Xia, Paul Blanchard, Ruopeng Zhang, Andrew Minor, Norman Sanford

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

Frances Allen, John Notte, Deying Xia, Paul Blanchard, Ruopeng Zhang, Andrew Minor, Norman Sanford; Neon-FIB for the Fabrication of Tips for Atom Probe Tom

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Ion-surface interactions and analysis

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References (5)

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1. 10.1016/j.nima.2010.12.22010.1016/j.nima.2010.12.220 ↗

2. 10.1111/jmi.1241610.1111/jmi.12416 ↗

3. 10.1111/j.1365-2818.2010.03401.x10.1111/j.1365-2818.2010.03401.x ↗

4. 10.1039/C8NR08224C10.1039/C8NR08224C ↗

5. 10.1557/mrs.2014.5310.1557/mrs.2014.53 ↗