journal article·1999-08-01

The 3d Parameters Of A (Nano)Crystal From Lattice Images At Two Tilts

Wentao Qin, Haresh Siriwardane, Phil Fraundorf

Microscopy and Microanalysis· Volume 5· Issue S2
Publisher page

Abstract

Abstract Various techniques have been developed to infer the 3D relationship of reciprocal lattice vectors from electron diffraction patterns taken at different specimen orientations. Such relationship is subsequently applied in crystallographic analyses. Due to the transmitted nature of the electron beam, TEM images present 3D information averaged throughout the thickness of the specimen on each micrograph. Techniques for acquiring 3D information from such images include stereomicroscopy for characterizing irregular dislocation networks, and 3D reconstruction of nonperiodic macromolecular assemblies. Prospects for finding the 3D lattice parameters of nanocrystals from HREM images taken at different specimen orientations have been discussed. Here we apply this stereo lattice imaging to a 7 nm crystal, and discuss its application to compact fee and bec lattices in general. Results on other lattice types will be published separately. Generally 3 non-coplanar lattice vectors seen along 2 different zone axes are sufficient for inferring a subset of the 3D reciprocal lattice of a single crystal.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · X-ray Diffraction in Crystallography

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Affiliations

Physics & Astronomy Department and CME, University of Missouri-StL , St. Louis, MO 63121

References (4)

Show source-provided references
1. Liu · Micron and Microscopica Acta · 1989 · 20 · 255
2. Hirsch · 1977 · 310
3. Frank · 1
4. Fraundorf · Ultramicroscopy · 1987 · 22 · 22510.1016/0304-3991(87)90066-0 ↗