journal article·2019-08Open access

Observing Structural Dynamics and Measuring Chemical Kinetics in Low Dimensional Materials Using High Speed Imaging

A I Kirkland, C. S. Allen, E. Besley, C. Huang, J. Kim, S. Skowron, J. Warner

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

Journal Article Observing Structural Dynamics and Measuring Chemical Kinetics in Low Dimensional Materials Using High Speed Imaging Get access A I Kirkland, A I Kirkland Department of Materials, Parks Road, Oxford, UKElectron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source Ltd, Didcot, UK Corresponding author: angus.kirkland@materials.oc.ac.uk Search for other works by this author on: Oxford Academic Google Scholar C S Allen, C S Allen Department of Materials, Parks Road, Oxford, UKElectron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source Ltd, Didcot, UK Search for other works by this author on: Oxford Academic Google Scholar E Besley, E Besley School of Chemistry, University of Nottingham, University Park, Nottingham, UK Search for other works by this author on: Oxford Academic Google Scholar C Huang, C Huang Department of Materials, Parks Road, Oxford, UKElectron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source Ltd, Didcot, UK Search for other works by this author on: Oxford Academic Google Scholar J Kim, J Kim Department of Materials, Parks Road, Oxford, UKElectron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source Ltd, Didcot, UK Search for other works by this author on: Oxford Academic Google Scholar S Skowron, S Skowron School of Chemistry, University of Nottingham, University Park, Nottingham, UK Search for other works by this author on: Oxford Academic Google Scholar J Warner J Warner Department of Materials, Parks Road, Oxford, UK Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1682–1683, https://doi.org/10.1017/S1431927619009140 Published: 01 August 2019
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Ion-surface interactions and analysis

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References (6)

Show source-provided references
1. The authors acknowledge Diamond Light Source for access and support in use of the electron Physical Science Imaging Centre that contributed to the results presented here.
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6. J Song , Scientific Reports, in press, (2019).