Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification

Journal Article Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification Get access Kyle Crosby, Kyle Crosby Carl Zeiss Microscopy LLC, Business Development mSEM, One Zeiss Drive, Thornwood, USA Search for other works by this author on: Oxford Academic Google Scholar Tomasz Garbowski, Tomasz Garbowski Carl Zeiss Microscopy GmbH, Business Development mSEM, Oberkochen, Germany Search for other works by this author on: Oxford Academic Google Scholar Stephan Nickell Stephan Nickell Carl Zeiss Microscopy GmbH, Business Development mSEM, Oberkochen, Germany Corresponding author: Stephan.Nickell@Zeiss.com Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 192–193, https://doi.org/10.1017/S1431927619001697 Published: 01 August 2019