Double-Slit Electron Interference Experiment with Zero Propagation Distance Using Electron Biprism

Ken Harada; Tetsuji Kodama; Tetsuya Akashi; Yoshio Takahashi; Keiko Shimada; Yoshimasa A. Ono; Daisuke Shindo; Hiroyuki Shinada; Shigeo Mori

doi:10.1017/s1431927619005452

journal article·2019-08Open access

Double-Slit Electron Interference Experiment with Zero Propagation Distance Using Electron Biprism

Ken Harada, Tetsuji Kodama, Tetsuya Akashi, Yoshio Takahashi, Keiko Shimada, Yoshimasa A. Ono, Daisuke Shindo, Hiroyuki Shinada, Shigeo Mori

Microscopy and Microanalysis· Volume 25· Issue S2

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Abstract

Ken Harada, Tetsuji Kodama, Tetsuya Akashi, Yoshio Takahashi, Keiko Shimada, Yoshimasa A Ono, Daisuke Shindo, Hiroyuki Shinada, Shigeo Mori; Double-Slit El

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena

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References (5)

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1. 10.1038/s41598-018-19380-410.1038/s41598-018-19380-4 ↗

2. 10.1063/1.490817510.1063/1.4908175 ↗

3. 10.1063/1.171515510.1063/1.1715155 ↗

4. 10.1017/S143192761801031010.1017/S1431927618010310 ↗

5. This work was supported by KAKENHI, Grant-in-Aid for Scientific Research ((B) 18H03475).