In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging
Source abstract
Abstract
Mikhail Dutka, Romaine Isaacs, Anna Prokhodtseva, Tomáš Vystavěl; In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging, Micro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1002/9783527808465.EMC2016.602410.1002/9783527808465.EMC2016.6024 ↗
2. 10.1017/S143192761700217310.1017/S1431927617002173 ↗