journal article·2019-08Open access

Latest Generation of Silicon Drift Detectors and Readout Electronics

Andreas Pahlke, Florian Dams, Reinhard Fojt, Michael Fraczek, Jürgen Knobloch, Christian Luckey, Natsuki Miyakawa, Niklas Willems

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

Andreas Pahlke, Florian Dams, Reinhard Fojt, Michael Fraczek, Jürgen Knobloch, Christian Luckey, Natsuki Miyakawa, Niklas Willems; Latest Generation of Sil
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: CCD and CMOS Imaging Sensors · Advancements in Semiconductor Devices and Circuit Design · Radiation Effects in Electronics

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References (2)

Show source-provided references
1. 10.1002/pssb.20155221610.1002/pssb.201552216 ↗
2. 10.1109/TNS.2015.239611610.1109/TNS.2015.2396116 ↗