journal article·2019-08Open access

Precession Electron Diffraction (PED) Strain Measurements in Stacked Nanosheet Structures

J Li, S Mochizuki, J Zhang, N Loubet, J Gaudiello, B Haran

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Advanced Surface Polishing Techniques · Copper Interconnects and Reliability

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References (3)

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1. This work was performed by the Research Alliance teams at various IBM Research and Development Facilities.
2. 10.1063/1.501099710.1063/1.5010997 ↗
3. Ghani · IEDM · 2003 · 1161