Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy

C.S. Bonifacio; P. Nowakowski; K. Costello; M.L. Ray; R. Morrison; P.E. Fischione

doi:10.1017/s1431927619013503

journal article·2019-08Open access

Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy

C.S. Bonifacio, P. Nowakowski, K. Costello, M.L. Ray, R. Morrison, P.E. Fischione

Microscopy and Microanalysis· Volume 25· Issue S2

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Abstract

CS Bonifacio, P Nowakowski, K Costello, ML Ray, R Morrison, PE Fischione; Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environmen

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Advanced Materials Characterization Techniques · Force Microscopy Techniques and Applications · Hydrogen embrittlement and corrosion behaviors in metals

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References (5)

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4. Bonifacio · 19th International Microscopy Congress · 2018 · 669

5. 10.1017/S143192761700202110.1017/S1431927617002021 ↗