SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

Coherent X-ray and extreme ultraviolet (EUV) beams can visualize and characterize the structure and functions of material, from tens of microns down to nanometer scales Recent exciting advances from facility-scale synchrotron-based X-ray ptychography has pushed soft X-ray imaging toward 5 nm spatial resolution [3]; in complementary work, tabletop-scale laser-driven high-harmonic based ptychography has achieved sub-wavelength spatial resolution, achieving 12.6 nm spatial resolution at a wavelength of 13.5 nm Combined with spectroscopic techniques that provide high elemental and chemical specificity, X-ray and EUV spectral imaging can reveal material and biological structures with unprecedented detail to correlate structure-property relations.