Multi-order Scaling of High-throughput Transmission Electron Microscopy

Journal Article Multi-order Scaling of High-throughput Transmission Electron Microscopy Get access Christopher S Own, Christopher S Own Voxa, Seattle, WA USA Corresponding author: csown@voxa.co Search for other works by this author on: Oxford Academic Google Scholar Theodore DeRego, Theodore DeRego Voxa, Seattle, WA USA Search for other works by this author on: Oxford Academic Google Scholar Lawrence S Own, Lawrence S Own Voxa, Seattle, WA USA Search for other works by this author on: Oxford Academic Google Scholar Gerward Weppelman, Gerward Weppelman Voxa, Seattle, WA USA Search for other works by this author on: Oxford Academic Google Scholar Adrian A Wanner, Adrian A Wanner Princeton Neuroscience Institute, NJ, USA Search for other works by this author on: Oxford Academic Google Scholar Sebastian Ströh, Sebastian Ströh Princeton Neuroscience Institute, NJ, USA Search for other works by this author on: Oxford Academic Google Scholar Eric Hammerschmith, Eric Hammerschmith Princeton Neuroscience Institute, NJ, USA Search for other works by this author on: Oxford Academic Google Scholar Ashwin Vishwanathan, Ashwin Vishwanathan Princeton Neuroscience Institute, NJ, USA Search for other works by this author on: Oxford Academic Google Scholar H Sebastian Seung H Sebastian Seung Princeton Neuroscience Institute, NJ, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1040–1041, https://doi.org/10.1017/S1431927619005932 Published: 01 August 2019