Probing Thermal-induced Phonon Energy Shift of SiC in Nanoscale by in situ Vibrational Spectroscopy
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Abstract
Xingxu Yan, Chengyan Liu, Chaitanya A Gadre, Ruqian Wu, Xiaoqing Pan; Probing Thermal-induced Phonon Energy Shift of SiC in Nanoscale by in situ Vibrationa
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Silicon Carbide Semiconductor Technologies · Semiconductor materials and devices
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References (8)
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2. 10.1038/nature2169910.1038/nature21699 ↗
3. This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. TEM experiments was conducted using the facilities in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.
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