Phase Imaging beyond the Diffraction Limit with Electron Ptychography

David A. Muller; Zhen Chen; Yi Jiang; Michal Odstrcil; Yimo Han; Prafull Purohit; Mark W. Tate; Sol M. Gruner; Veit Elser

doi:10.1017/s143192761900076x

journal article·2019-08Open access

Phase Imaging beyond the Diffraction Limit with Electron Ptychography

David A. Muller, Zhen Chen, Yi Jiang, Michal Odstrcil, Yimo Han, Prafull Purohit, Mark W. Tate, Sol M. Gruner, Veit Elser

Microscopy and Microanalysis· Volume 25· Issue S2

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OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Crystallography and Radiation Phenomena

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References (5)

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2. 10.1038/s41586-018-0298-510.1038/s41586-018-0298-5 ↗

3. 10.1016/j.ultramic.2009.05.01210.1016/j.ultramic.2009.05.012 ↗

4. We thank Jiwoong Park, Saien Xie, Hui Gao, Ming-Hui Chiu, and Lain-Jong Li for samples. Research supported by US National Science Foundation (grants DMR-1539918, DMR-1429155, DMR-1719875) & US Department of Energy Basic Energy Sciences (DE-SC0005827).

5. 10.1017/S143192761501566410.1017/S1431927615015664 ↗