Performance of a high count rate silicon drift x-ray detector on the anl 300 kv advanced analytical electron microscope.
Source abstract
Abstract
N J Zaluzec, J S Iwanczyk, B E Patt, S Barkan, L Feng; Performance of a high count rate silicon drift x-ray detector on the anl 300 kv advanced analytical
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · X-ray Spectroscopy and Fluorescence Analysis
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