Low Background Glass Substrates for Microanalysis
Source abstract
Abstract
ES Windsor, CJ Zeissler, SA Wight, EB Steel, DH Blackburn; Low Background Glass Substrates for Microanalysis, Microscopy and Microanalysis, Volume 8, Issue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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