The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased p-n Junctions from Electron Holograms
Source abstract
Abstract
RE Dunin-Borkowski, AC Twitchett, PA Midgley; The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased p-n Jun
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Semiconductor materials and interfaces · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.