Atomic-Resolution Study of Grain Boundaries in CdTe Using Scanning Transmission Electron Microscopy
Source abstract
Abstract
Jinglong Guo, Fatih G Sen, Luhua Wang, Seungjin Nam, Moon Kim, Maria K Y Chan, Robert F Klie; Atomic-Resolution Study of Grain Boundaries in CdTe Using Sca
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (4)
Show source-provided references
1. 10.1107/S205327331401963910.1107/S2053273314019639 ↗
2. 10.1038/srep2700910.1038/srep27009 ↗
3. Res. Appl · 2014 · 23 · 1
4. 10.1063/1.173603410.1063/1.1736034 ↗