Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures
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Source: openalex_inverted_index · Quality: short
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
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1. 10.1021/jp072570s10.1021/jp072570s ↗
2. J. Vac. Sci. Technol. B · 2017 · 35 · 031601
3. 10.1046/j.1365-2818.1997.2550812.x10.1046/j.1365-2818.1997.2550812.x ↗
4. 10.1088/0957-4484/27/35/35530210.1088/0957-4484/27/35/355302 ↗
5. 10.1039/C6RA18214C10.1039/C6RA18214C ↗