Correlative In-Situ Analysis on the Nanoscale by combination of AFM and SEM

M. Winhold; M. Leitner; P. Frank; N. Hosseini; J. Sattelkov; G.E. Fantner; H. Plank; C.H. Schwalb

doi:10.1017/s1431927618010097

journal article·2018-08Open access

Correlative In-Situ Analysis on the Nanoscale by combination of AFM and SEM

M. Winhold, M. Leitner, P. Frank, N. Hosseini, J. Sattelkov, G.E. Fantner, H. Plank, C.H. Schwalb

Microscopy and Microanalysis· Volume 24· Issue S1

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Abstract

M Winhold, M Leitner, P Frank, N Hosseini, J Sattelkov, GE Fantner, H Plank, CH Schwalb; Correlative In-Situ Analysis on the Nanoscale by combination of AF

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications · Microstructure and mechanical properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (2)

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1. Microscopy and Analysis · 2017 · 31 · 14

2. 10.1063/1.498331710.1063/1.4983317 ↗