Measuring the minority carrier diffusion length in n-GaN using bulk STEM EBIC

Zoey Warecki; Vladimir Oleshko; Kimberlee Celio; Andrew Armstrong; Andrew Allerman; A. Alec Talin; John Cumings

doi:10.1017/s1431927618009698

journal article·2018-08Open access

Measuring the minority carrier diffusion length in n-GaN using bulk STEM EBIC

Zoey Warecki, Vladimir Oleshko, Kimberlee Celio, Andrew Armstrong, Andrew Allerman, A. Alec Talin, John Cumings

Microscopy and Microanalysis· Volume 24· Issue S1

Publisher page Open full text

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Abstract

Zoey Warecki, Vladimir Oleshko, Kimberlee Celio, Andrew Armstrong, Andrew Allerman, A Alec Talin, John Cumings; Measuring the minority carrier diffusion le

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: GaN-based semiconductor devices and materials · Semiconductor Quantum Structures and Devices · Advancements in Semiconductor Devices and Circuit Design

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References (4)

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2. 10.1063/1.500681410.1063/1.5006814 ↗

3. 10.1149/2.0251602jss10.1149/2.0251602jss ↗

4. 10.1016/j.jallcom.2014.11.22910.1016/j.jallcom.2014.11.229 ↗