Joy of Scanning with Electron and X-ray Imaging
Source abstract
Abstract
Philippe T Pinard, Simon Burgess, Anthony Hyde, James Holland, Peter Statham; Joy of Scanning with Electron and X-ray Imaging, Microscopy and Microanalysis
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Radiomics and Machine Learning in Medical Imaging
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S143192761300575810.1017/S1431927613005758 ↗
2. 10.1017/S143192761300845310.1017/S1431927613008453 ↗