DataVXMicroscopy and MicroanalysisPaper
journal article·2018-08Open access

Hard X-ray Resonant Ptychography for Chemical Imaging at the Sensitivity Limit

Juliane Reinhardt, Andreas Schropp, Mikhail Lyubomirskiy, Martin Seyrich, Dennis Bruckner, Thomas F. Keller, Vedran Vonk, Sergey Volko, Andreas Stierle, Edvinas Navickas, Jürgen. Fleig, Christian G. Schroer

Microscopy and Microanalysis· Volume 24· Issue S2
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Abstract

Reinhardt, Juliane; Schropp, Andreas; Lyubomirskiy, Mikhail; Seyrich, Martin; Bruckner, Dennis; Keller, Thomas F.; Vonk, Vedran; Volko, Sergey; Stierle, Andreas; Navickas, Edvinas; Fleig, Jürgen.; Schroer, Christian G.
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Crystallography and Radiation Phenomena · Nuclear Physics and Applications

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References (3)

Show source-provided references
1. 10.1016/j.ultramic.2016.11.00510.1016/j.ultramic.2016.11.005 ↗
2. 10.1063/1.472994210.1063/1.4729942 ↗
3. 10.1063/1.480702010.1063/1.4807020 ↗