White Beam Differential Phase and Dark Field Imaging at High Resolution

X-ray phase-contrast imaging (XPCI) can extend the capabilities of conventional radiography and, by \nexploiting phase effects, make visible those details that lack enough absorption contrast [1]. Several \napproaches have been proposed for XPCI by using synchrotron radiation, microfocal and extended \nlabortory sources [2]. We focus here on edge illumination [3] in view of its properties of high resolution, \nsensitivity, robustness and achromaticity [4-6]. The latter is of particular interest for the study reported \nhere, where we used the direct beam from a bending magnet, aiming at making use of a spectral \ndistribution as broad as possible.