Sub-Å STEM Resolution From 30-300kV
Source abstract
Abstract
Maarten Bischoff, Marcel Niestadt, Veli Altin, Alexander Henstra, Peter Tiemeijer, Bert Freitag, Christian Maunders, Peter Hartel, Eric Van Cappellen; Sub-
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.