Investigation of slice thickness for FIB tomography in a plasma focused ion beam system
Source abstract
Abstract
Brandon Van Leer, Ron Kelley, Bartlomiej Winiarski; Investigation of slice thickness for FIB tomography in a plasma focused ion beam system, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/j.ultramic.2014.01.00310.1016/j.ultramic.2014.01.003 ↗
2. 2nd International Congress on 3D Mat. Sci · 2014 · 119
3. 10.1016/j.ultramic.2015.11.00110.1016/j.ultramic.2015.11.001 ↗
4. J. Am Ceram. Soc · 2006 · 89 [8] · 2577