The Effect of a Pulsed Electron Beam on Damage Threshold
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Abstract
Elisah J VandenBussche, David J Flannigan; The Effect of a Pulsed Electron Beam on Damage Threshold, Microscopy and Microanalysis, Volume 24, Issue S1, 1 A
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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References (9)
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1. 10.1016/j.cplett.2017.01.05510.1016/j.cplett.2017.01.055 ↗
2. Acta Crystallogr. Sect. A · 1980 · 36 · 592
3. Acta Crystallogr. Sect. A · 1959 · 12 · 294
4. 10.1088/1367-2630/12/3/03500710.1088/1367-2630/12/3/035007 ↗
5. 10.1016/j.ultramic.2016.08.00710.1016/j.ultramic.2016.08.007 ↗
6. 10.1016/j.micron.2004.02.00310.1016/j.micron.2004.02.003 ↗
7. 10.1016/j.ultramic.2012.07.00610.1016/j.ultramic.2012.07.006 ↗
8. 10.1007/BF0054077210.1007/BF00540772 ↗
9. Phys. Rev. B · 2013 · 88 · 24305