Thick (3D) Sample STEM Imaging at Nano Scale: iDPC and ADF Simultaneously
Source abstract
Abstract
Eric GT Bosch, Ivan Lazic, Emrah Yucelen, Piet Trompenaars; Thick (3D) Sample STEM Imaging at Nano Scale: iDPC and ADF Simultaneously, Microscopy and Micro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
1. 10.1016/j.ultramic.2017.01.01410.1016/j.ultramic.2017.01.014 ↗
2. 10.1098/rsta.2009.007410.1098/rsta.2009.0074 ↗
3. 10.1016/j.ultramic.2006.04.01810.1016/j.ultramic.2006.04.018 ↗
4. 10.1016/j.ultramic.2010.04.00410.1016/j.ultramic.2010.04.004 ↗
5. Ultramicroscopy 160 · 2016 · 265
6. 10.1016/bs.aiep.2017.01.00610.1016/bs.aiep.2017.01.006 ↗
7. 10.1016/j.ultramic.2015.02.00410.1016/j.ultramic.2015.02.004 ↗
8. 10.1038/s41598-018-20377-210.1038/s41598-018-20377-2 ↗